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Class-leading, SEM installed in Delft, the Netherlands, with enhanced, rapid-scan EDS software.
AGR’s testing laboratory in the Netherlands, the birthplace of the microscope, is now home to a new, top-of-class Scanning Electron Microscope (SEM)! Some of the first practical microscopes were invented by Delft microscopist Antonie van Leeuwenhoek in the 1700s; AGR’s Delft laboratory is proud to continue the fine tradition of Dutch microscopy by purchasing and installing a JEOL IT-510LA scanning electron microscope. This new capability will provide our European customers with the highest level of analysis and digital data acquisition.
Our JEOL IT-510LA represents the first SEM of this model to be installed anywhere in the Netherlands and boasts a magnification capability of up to 300,000X. Equipped with a JEOL Energy  Diffractive X-ray Spectrometer (EDS), the SEM enables chemical compositional analysis of glass surfaces/substrates along with point analysis of materials or residues embedded on or within the glass. Enhanced software harnesses the EDS for constant scanning of the glass surface over the entire field of view, immediately highlighting the presence of any foreign materials for ease of operator identification.
In addition, the large-sized SEM chamber allows samples up to 200 mm long and 80 mm wide to be analyzed without first cutting them down, while low vacuum mode circumvents the need to apply carbon or metal coating. These features permit analysis of samples with minimal alteration, which is an advantage for consumer complaints or product liability cases. Along with these advanced functions, AGR routinely uses SEM-EDS for stone identification, fracture diagnosis, and compositional analysis.
If you find yourself in Delft, we welcome you to visit our laboratory and observe a demonstration of this new, advanced microscope. To discuss your glass analysis needs or submit samples for SEM-EDS analysis, please Contact Us or call our Delft Team at: +31 (0)15 890 40 20
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